fbpx High energy ion scattering yields (HEIS) and X ray photoelectron intensities (XPS) from simulated bimetallic surfaces using Monte Carlo methods: Thin Ni films on Al(110) |ARAB AMERICAN UNIVERSITY
Contact information for Technical Support and Student Assistance ... Click here

High energy ion scattering yields (HEIS) and X ray photoelectron intensities (XPS) from simulated bimetallic surfaces using Monte Carlo methods: Thin Ni films on Al(110)

Authors: 
V. Shutthanandan
Adli A. Saleh
R. J. Smith
Conference: 
March meeting of the American physical society
Location: 
Pittsburgh, PA
Date: 
Monday, March 21, 1994
Copyright © Arab American University 2000-2024. All rights Reserved.