In her thesis, she addressed the ZnS/Ge/GaSe chips design
The spectroscopy of ZnS/Ge/GaSe layers was studied by electronic microscopy, x-ray dispersion spectroscopy, X-ray diffraction, spectrophotometer and impedance spectrum. The researcher also diagnosed the voltage and current curves under tungsten light on the GaSe layer surface from the top. She noted during her study that the ZnS layer is the only crystallized layer and that the other layers are randomly structured.
